Published April 15, 2010
| Version v1
Journal article
Li-ion diffusion in amorphous Si films prepared by RF magnetron sputtering: A comparison of using liquid and polymer electrolytes
- 1. Department of Chemistry, Faculty of Engineering, Mie University, 1577 Kurimamachiya-cho, Tsu, Mie 514-8507 (Japan)
Description
Amorphous Si films were prepared by radio frequency magnetron sputtering on Cu substrates and were characterized by X-ray diffraction and scanning electron microscopy. The potential dependence of Li-ion chemical diffusion coefficients, D-tildeLi, in the films was determined by electrochemical impedance spectroscopy (EIS) and potentiostatic intermittent titration technique (PITT) using liquid and polymer electrolytes. The D-tildeLi values obtained using the polymer electrolyte were lower than those using the liquid electrolyte. It was found that the D-tildeLi values of the Si film measured by PITT and EIS using the polymer electrolyte were in the range of 4 x 10-13-2 x 10-13 cm2 s-1 and 4 x 10-13-10-14 cm2 s-1, respectively, at 50 deg. C.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchemphys.2009.11.031Additional details
Identifiers
- DOI
- 10.1016/j.matchemphys.2009.11.031;
- PII
- S0254-0584(09)00711-1;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 120
- Journal Issue
- 2-3
- Journal Page Range
- p. 421-425
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44020068
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AMORPHOUS STATE; COMPARATIVE EVALUATIONS; COPPER; DIFFUSION; ELECTROCHEMISTRY; ELECTROLYTES; FILMS; IMPEDANCE; LITHIUM IONS; POLYMERS; RADIOWAVE RADIATION; SCANNING ELECTRON MICROSCOPY; SILICON; SPUTTERING; SUBSTRATES; TITRATION; X-RAY DIFFRACTION
- Descriptors DEC
- CHARGED PARTICLES; CHEMICAL ANALYSIS; CHEMISTRY; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; EVALUATION; IONS; METALS; MICROSCOPY; QUANTITATIVE CHEMICAL ANALYSIS; RADIATIONS; SCATTERING; SEMIMETALS; TRANSITION ELEMENTS; VOLUMETRIC ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.