Published 1976
| Version v1
Book
Scanning proton microprobe in an atmospheric environment
Description
The advantages and limitations of the scanning proton microprobe (SPM) for determining the spacial distribution of elements are discussed. Special attention is given to the SPM with x-ray detection in which the sample is in an atmospheric environment. This development retains the high sensitivity of SPM to the detection of trace elements in thick targets, with beams of micron resolution, and adds the important capability of examining hydrated samples. Illustrations are given of recent application of the technique to the study of single strands of hair, hydrated tissue, and solid state materials
Additional details
Publishing Information
- Publisher
- Institute of Electrical and Electronics Engineers, Inc.
- Imprint Place
- New York
- Imprint Title
- Proceedings of the fourth conference on the scientific and industrial applications of small accelerators
- Journal Page Range
- p. 75-90.
Conference
- Title
- 4. annual conference on the use of small accelerators.
- Dates
- 25 Oct 1976.
- Place
- Denton, TX, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 9383246
- Subject category
- S43: PARTICLE ACCELERATORS; S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCELERATOR FACILITIES; BREMSSTRAHLUNG; ELEMENTS; ION MICROSCOPY; PROTON BEAMS; TRACE AMOUNTS; USES; VAN DE GRAAFF ACCELERATORS; X RADIATION
- Descriptors DEC
- ACCELERATORS; BEAMS; ELECTROMAGNETIC RADIATION; ELECTROSTATIC ACCELERATORS; IONIZING RADIATIONS; MICROSCOPY; NUCLEON BEAMS; PARTICLE BEAMS; RADIATIONS
Optional Information
- Notes
- Imprint:See CONF-761059--.