Published August 2017 | Version v1
Journal article

X-ray fluorescence – a non-destructive tool in investigation of Czech fine and applied art objects

Description

A brief review of application of X-ray fluorescence analysis (XRFA) to fine and applied arts related to Czech cultural heritage is presented. The Department of Dosimetry and Application of Ionising Radiation of CTU-FNSPE has used XRFA in collaboration with various Czech institutions dealing with cultural history for many kinds of artefacts, (e.g., Roman and medieval brass, gemstones and noble metals from the sceptre of one of the faculties of the Charles University in Prague, millefiori beads, etc.). In some cases, a combination of various other techniques alongside XRFA was used for enhancing our knowledge of a measured object. - Highlights: • X-ray fluorescence analysis is a versatile tool for investigations into cultural heritage. • Applications of XRFA in the field of fine and applied arts are briefly reviewed. • The applications are based on investigations of Czech cultural heritage. • Improvements to instrumentation and techniques are mentioned. • Selected results of the investigations are commented in the historical context.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.radphyschem.2017.01.007

Additional details

Identifiers

DOI
10.1016/j.radphyschem.2017.01.007;
PII
S0969-806X(17)30059-2;

Publishing Information

Journal Title
Radiation Physics and Chemistry (1993)
Journal Volume
137
Journal Page Range
p. 230-233
ISSN
0969-806X
CODEN
RPCHDM

Conference

Title
13. international symposium on radiation physics
Acronym
ISRP-13
Dates
7-11 Sep 2015
Place
Beijing (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49049607
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CULTURAL OBJECTS; EDUCATIONAL FACILITIES; TOOLS; X RADIATION; X-RAY FLUORESCENCE ANALYSIS
Descriptors DEC
CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; EQUIPMENT; IONIZING RADIATIONS; NONDESTRUCTIVE ANALYSIS; RADIATIONS; X-RAY EMISSION ANALYSIS

Optional Information

Copyright
Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.