Published September 2010
| Version v1
Journal article
Evaluation of half-value layers calculated from spectra measured with CdTe detector for X-ray computed tomography
Creators
- 1. Osaka Univ., Graduate School of Medicine, Suita, Osaka (Japan)
- 2. Osaka Prefecture Acute Medical Center, Osaka, Osaka (Japan)
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Igaku Butsuri. Supplement
- Journal Volume
- 30
- Journal Issue
- suppl.5
- Journal Page Range
- p. 223-224
- ISSN
- 1345-5362
Conference
- Title
- 100. scientific meeting of Japan Society of Medical Physics
- Dates
- 23-25 Sep 2010
- Place
- Tokyo (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 42074528
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S62: RADIOLOGY AND NUCLEAR MEDICINE;
- Resource subtype / Literary indicator
- No Abstract, Conference
- Descriptors DEI
- ACCURACY; ALUMINIUM; CARBON; CAT SCANNING; CDTE SEMICONDUCTOR DETECTORS; COMPTON SPECTROMETERS; COMPUTERIZED SIMULATION; DOSEMETERS; IONIZATION CHAMBERS; MONTE CARLO METHOD; PMMA; X-RAY SPECTRA; X-RAY TUBES
- Descriptors DEC
- CALCULATION METHODS; COMPUTERIZED TOMOGRAPHY; DIAGNOSTIC TECHNIQUES; ELECTRON TUBES; ELEMENTS; EQUIPMENT; ESTERS; GAMMA SPECTROMETERS; MEASURING INSTRUMENTS; METALS; NONMETALS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; POLYACRYLATES; POLYMERS; POLYVINYLS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SIMULATION; SPECTRA; SPECTROMETERS; TOMOGRAPHY; X-RAY EQUIPMENT