Published July 1, 2017 | Version v1
Journal article

Ultrathin Cu(In,Ga)Se2 solar cells with point-like back contact in experiment and simulation

  • 1. Martin-Luther-Universität, Institute of Physics, Von-Danckelmann-Platz 3, 06120, Halle (Saale) (Germany)
  • 2. Martin-Luther-Universität, Interdisciplinary Center of Material Science, Heinrich-Damerow-Straße 4, 06120, Halle (Saale) (Germany)

Description

We apply the concept of point contact solar cells to a model system having 190 nm thick Cu(In,Ga)Se2 (CIGSe) films by using a SiO2 back side film with periodic openings to the molybdenum layer being the electrical contact. The openings are plasma etched through a mask prepared by laser interference lithography. We find a maximum increase of the short circuit current density of 25% for a SiO2 thickness of 60 nm and structure length of 1,1 μm. This gain is due to (1) coherent optical reflection, (2) light scattering enhancing the quantum efficiency at all wavelengths and (3) an anticipated wave guide effect which boosts the quantum efficiency particularly at long wavelength. The best efficient solar cells with 190 nm thick CIGSe has a conversion efficiency of 9% (fill factor = 70%) without anti-reflection coating. These experimental results can largely be confirmed by simulation. - Highlights: • Local point contacts were realized at the back side of Cu(In,Ga)Se2 solar cells. • A silicon back reflector with 70% coverage gives 25% increase in short circuit current. • A solar cell using 190 nm thick Cu(In,Ga)Se2 exhibits 9% energy conversion efficiency.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2016.11.003

Additional details

Identifiers

DOI
10.1016/j.tsf.2016.11.003;
PII
S0040-6090(16)30688-5;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
633
Journal Page Range
p. 61-65
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
E-MRS 2016 Spring Meeting, Symposium V, thin-film chalcogenide photovoltaic materials
Dates
2-6 May 2016
Place
Lille (France)

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.