Published 1993 | Version v1
Journal article Metadata-only

PIXE analysis of rare earth elements

Creators

  • 1. Instituto Nacional de Investigaciones Nucleares, Mexico City (Mexico)

Description

In this paper a review of data from the available literature on the REE (rare earth elements) analysis by PIXE is presented. General comments, a discussion of essentials, and a survey of applications are also included. (author) 52 refs

Additional details

Publishing Information

Journal Title
International Journal of PIXE
Journal Volume
3
Journal Issue
2
Journal Page Range
p. 129-143.
ISSN
0129-0835
CODEN
IJPXET

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
26049323
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
CROSS SECTIONS; INNER-SHELL IONIZATION; K SHELL; L SHELL; MEV RANGE 10-100; MISCH METAL; PIXE ANALYSIS; PROTON BEAMS; REVIEWS; SENSITIVITY
Descriptors DEC
ALLOYS; BEAMS; CERIUM ALLOYS; CERIUM BASE ALLOYS; CHEMICAL ANALYSIS; DOCUMENT TYPES; ELECTRONIC STRUCTURE; ENERGY RANGE; IONIZATION; LANTHANUM ALLOYS; MEV RANGE; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; PARTICLE BEAMS; RARE EARTH ALLOYS; X-RAY EMISSION ANALYSIS