Published October 2003 | Version v1
Journal article

Nanotribological characterization of molecularly thick lubricant films for applications to MEMS/NEMS by AFM

Description

Molecularly thick perfluoropolyether (PFPE) films are considered to be good protective films for micro/nanoelectromechanical systems (MEMS/NEMS) to reduce stiction, friction, and improve their durability. Understanding the nanotribological performance and mechanisms of these films are quite important for efficient lubrication for MEMS/NEMS devices. These devices are used in various operating environments and their effect on friction, adhesion and durability needs to be clarified. For this purpose, mobile and chemically bonded PFPE films were deposited by dip coating technique. The friction and adhesion properties of these films were characterized by atomic force microscopy (AFM). The effect of rest time, velocity, relative humidity, and temperature on nanotribological properties of these films was studied. Durability of these films was also measured by repeated cycling tests. The adhesion, friction mechanisms of PFPE at molecular scale, and the mechanisms of the effect of operating environment and durability are subject of this paper. This study found that adsorption of water, formation of meniscus and its change during sliding, viscosity, and surface chemistry properties play a big role on the friction, adhesion, and durability of the lubricant films

Additional details

Identifiers

DOI
10.1016/S0304-3991;
PII
S0304399103000585;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
97
Journal Issue
1-4
Journal Page Range
p. 321-340
ISSN
0304-3991
CODEN
ULTRD6

Conference

Title
4. international conference on scanning probe microscopy, sensors and nanostructures
Dates
26-29 May 2002
Place
Las Vegas, NV (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37039645
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ADSORPTION; ATOMIC FORCE MICROSCOPY; ELECTROMECHANICS; EQUIPMENT; FRICTION; LUBRICANTS; LUBRICATION; MICROSTRUCTURE; PERFORMANCE; SURFACE PROPERTIES; SURFACES; THIN FILMS; VISCOSITY
Descriptors DEC
FILMS; MECHANICS; MICROSCOPY; SORPTION

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.