Nanotribological characterization of molecularly thick lubricant films for applications to MEMS/NEMS by AFM
Creators
Description
Molecularly thick perfluoropolyether (PFPE) films are considered to be good protective films for micro/nanoelectromechanical systems (MEMS/NEMS) to reduce stiction, friction, and improve their durability. Understanding the nanotribological performance and mechanisms of these films are quite important for efficient lubrication for MEMS/NEMS devices. These devices are used in various operating environments and their effect on friction, adhesion and durability needs to be clarified. For this purpose, mobile and chemically bonded PFPE films were deposited by dip coating technique. The friction and adhesion properties of these films were characterized by atomic force microscopy (AFM). The effect of rest time, velocity, relative humidity, and temperature on nanotribological properties of these films was studied. Durability of these films was also measured by repeated cycling tests. The adhesion, friction mechanisms of PFPE at molecular scale, and the mechanisms of the effect of operating environment and durability are subject of this paper. This study found that adsorption of water, formation of meniscus and its change during sliding, viscosity, and surface chemistry properties play a big role on the friction, adhesion, and durability of the lubricant films
Additional details
Identifiers
- DOI
- 10.1016/S0304-3991;
- PII
- S0304399103000585;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 97
- Journal Issue
- 1-4
- Journal Page Range
- p. 321-340
- ISSN
- 0304-3991
- CODEN
- ULTRD6
Conference
- Title
- 4. international conference on scanning probe microscopy, sensors and nanostructures
- Dates
- 26-29 May 2002
- Place
- Las Vegas, NV (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37039645
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ADSORPTION; ATOMIC FORCE MICROSCOPY; ELECTROMECHANICS; EQUIPMENT; FRICTION; LUBRICANTS; LUBRICATION; MICROSTRUCTURE; PERFORMANCE; SURFACE PROPERTIES; SURFACES; THIN FILMS; VISCOSITY
- Descriptors DEC
- FILMS; MECHANICS; MICROSCOPY; SORPTION
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.