Published March 5, 2014 | Version v1
Journal article

The formation of iron aluminides on aluminum surface by using a Q-switched Nd:YAG laser

  • 1. Advanced Photonic Science Institute, Faculty of Science, Universiti Teknologi Malaysia, Skudai, 81310, Johor (Malaysia)

Description

The formation and growth of Fe based aluminum diffusion layers at the Fe-Al interface have been investigated to improve the surface hardness. The diffusion of Fe into Al has been accomplished by focusing a Q-switched Nd:YAG laser on the modified surface. The variety of the layer depth is achieved based on the type of heating and quenching media. Microstructural characterization and mechanical properties of the modified surface were carried out via gas discharge spectrometer GDS, X-Ray diffraction (XRD), Scanning electron microscope (SEM), and Vickers Hardness tester. The results indicate that hardness at the interface of Fe-Al layer is increased. The optimum hardness achieved as 93 HV at corresponding critical energy density of 438 Jcm−2

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1588
Journal Issue
1
Journal Page Range
p. 135-139
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
4. international meeting on frontiers in physics
Dates
27-30 Aug 2013
Place
Kuala Lumpur (Malaysia)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45087229
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALUMINIUM; DIFFUSION; ENERGY DENSITY; HARDNESS; INTERFACES; IRON; LAYERS; MICROSTRUCTURE; NEODYMIUM LASERS; QUENCHING; SCANNING ELECTRON MICROSCOPY; SURFACES; VICKERS HARDNESS; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; LASERS; MECHANICAL PROPERTIES; METALS; MICROSCOPY; SCATTERING; SOLID STATE LASERS; TRANSITION ELEMENTS

Optional Information

Notes
(c) 2014 AIP Publishing LLC