Layer-by-layer atomic absorption spectroscopy determination of basic composition of Cdsub(X)Hgsub(1-x)Te monocrystals and films

The atomic-absorption method has been developed for layerby-layer determination of major composition of Cdsub(x)Hgsub(1-x)Te monocrystals and films. Layers were removed by chemical etching with the polishing etchant described in literature-8 per cent solution of bromine in HBr. The main components of monocrystals and films (cadmium, mercury and tellurium) were determined in etching solutions with the use of the atomic-absorption spectrophotometer Perkin-Elmer, when spraying solutions into an air-acetylene flame. The mutual influences of analyzer were studied as well as those of components of etching solutions. The optimal conditions have been chosen for atomic absorption determination of Cd, Hg, Te which enabled relative standard deviations to be obtained as following: 0.018 for Cd; 0.019 for Te; 0.037 for Hg. Absence has been illustrated of systematic errors