The detection technology of PIN silicon photodiode applied in the n/γ mixed radiation field
Creators
- 1. National Institute of Measurement and Testing Technology, Chengdu (China)
- 2. Chengdu University of Technology (China)
Description
PIN-type silicon semiconductor detectors, which is widely used in Personal dosimeters, X-ray fluorescence analysis, coating thickness measurement, diagnostic radiology and other particle radiation measurement, have faster response, stronger anti-interference, smaller size, higher sensitivity, higher energy resolution and without high voltage than traditional radiation detectors. We use the 6LiI crystal and BGO to change the n and γ-ray spectrum into the effective detection range of PIN. Referenced to the equivalent circuit model of the PIN silicon photodiode, we design the charge preamplifier circuit and the measurement system to match it. At the same time, we do the sample measurement and spectrum analysis of the preamplifier noise, pulse of rays and electromagnetic radiation interference digital measurement Finally, we complete the detectors repeatability, sensitivity, energy response performance testing experiments. (authors)
Additional details
Publishing Information
- Journal Title
- Nuclear Electronics and Detection Technology
- Journal Volume
- 31
- Journal Issue
- 12
- Journal Page Range
- p. 1341-1344
- ISSN
- 0258-0934
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 46041375
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CRYSTALS; DESIGN; DETECTION; DOSEMETERS; ELECTROMAGNETIC RADIATION; ENERGY RESOLUTION; EQUIVALENT CIRCUITS; GAMMA DETECTION; GAMMA RADIATION; JUNCTION DETECTORS; LITHIUM FLUORIDES; NEUTRON DETECTION; NOISE; PERFORMANCE TESTING; PULSES; SENSITIVITY; SI SEMICONDUCTOR DETECTORS; SILICON; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CHEMICAL ANALYSIS; DETECTION; ELECTROMAGNETIC RADIATION; ELECTRONIC CIRCUITS; ELEMENTS; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; IONIZING RADIATIONS; LITHIUM COMPOUNDS; LITHIUM HALIDES; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; RESOLUTION; SEMICONDUCTOR DETECTORS; SEMIMETALS; TESTING; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 7 figs., 2 tabs., 6 refs.