Published November 1, 1982
| Version v1
Journal article
Secondary electron emission from thin foils under fast ion bombardment
- 1. Liege Univ. (Belgium). Inst. de Physique Nucleaire
Description
The total yield of secondary electrons emitted when fast ions pass through a thin carbon foil has been measured as a function of the ion beam current and of the tilt angle of the target. We have shown that the dependence on the beam current can be interpreted as a temperature effect and that the dependence on the incidence angle is partly explained by geometrical considerations. (orig.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods Phys. Res.
- Journal Volume
- 202
- Journal Issue
- 1/2
- Series
- Nucl. Instrum. Methods Phys. Res.
- Journal Page Range
- 187-192
- ISSN
- 0029-554X
Conference
- Title
- 6. international conference on fast ion beam spectroscopy.
- Dates
- 17 - 20 Aug 1981.
- Place
- Quebec (Canada).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 14743809
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARBON; ELECTRON EMISSION; FILMS; FOILS; ION BEAMS; ION-ATOM COLLISIONS
- Descriptors DEC
- ATOM COLLISIONS; BEAMS; COLLISIONS; ELEMENTS; EMISSION; ION COLLISIONS; NONMETALS
Optional Information
- Notes
- With 32 refs.