Published November 1, 1982 | Version v1
Journal article

Secondary electron emission from thin foils under fast ion bombardment

  • 1. Liege Univ. (Belgium). Inst. de Physique Nucleaire

Description

The total yield of secondary electrons emitted when fast ions pass through a thin carbon foil has been measured as a function of the ion beam current and of the tilt angle of the target. We have shown that the dependence on the beam current can be interpreted as a temperature effect and that the dependence on the incidence angle is partly explained by geometrical considerations. (orig.)

Additional details

Publishing Information

Journal Title
Nucl. Instrum. Methods Phys. Res.
Journal Volume
202
Journal Issue
1/2
Series
Nucl. Instrum. Methods Phys. Res.
Journal Page Range
187-192
ISSN
0029-554X

Conference

Title
6. international conference on fast ion beam spectroscopy.
Dates
17 - 20 Aug 1981.
Place
Quebec (Canada).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
14743809
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CARBON; ELECTRON EMISSION; FILMS; FOILS; ION BEAMS; ION-ATOM COLLISIONS
Descriptors DEC
ATOM COLLISIONS; BEAMS; COLLISIONS; ELEMENTS; EMISSION; ION COLLISIONS; NONMETALS

Optional Information

Notes
With 32 refs.