Published March 1990 | Version v1
Journal article Metadata-only

Application of Monte Carlo method in X-ray fluorescence technique

Creators

  • 1. Chengdu Coll. of Geology, SC (China)
  • 2. Chinese Univ. of Geology (China)

Description

Characteristic X-ray intensities of elements in artificial Ni-Fe-Cr ternary samples are simulated using the Monte Carlo method and compared with experimental results. The intensity ratios of primary secondary, tertiary fluorescence, and Compton and Raly scattering are given. The relative efficiency curve of the Si(Li) detector for an energy range from 5 keV 10 keV, and the equivalent incident and exit angles of an annular 238Pu source under certain detection conditions are also calculated

Additional details

Publishing Information

Journal Title
Nuclear Techniques
Journal Volume
13
Journal Issue
3
Series
Nucl. Tech.
Journal Page Range
139-147
ISSN
0253-3219
CODEN
NUTED

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
22071030
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
CHROMIUM; COMPTON EFFECT; CORRECTIONS; EFFICIENCY; FLUORESCENCE; INCIDENCE ANGLE; IRON; LI-DRIFTED SI DETECTORS; MONTE CARLO METHOD; NICKEL; PHOTOELECTRIC EFFECT; PROGRAMMING; RAYLEIGH SCATTERING; SIMULATION; X-RAY FLUORESCENCE ANALYSIS
Descriptors DEC
BASIC INTERACTIONS; CHEMICAL ANALYSIS; COHERENT SCATTERING; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; ELEMENTS; EMISSION; INTERACTIONS; LI-DRIFTED DETECTORS; LUMINESCENCE; MEASURING INSTRUMENTS; METALS; NONDESTRUCTIVE ANALYSIS; PHOTON EMISSION; RADIATION DETECTORS; SCATTERING; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS