Published May 2008 | Version v1
Journal article

De Haas-van Alphen effect and magnetization in dodecaborides HoB12, ErB12 and TmB12

  • 1. B. Verkin Institute for Low Temperature Physics and Engineering of NASU, 47 Lenin Avenue, Kharkov 61103 (Ukraine)
  • 2. Graduate School of Science, Osaka University, Toyonaka 560-0810 (Japan)
  • 3. International Laboratory of High Magnetic Fields and Low Temperatures, Gajowicka 95, 53-529 Wroclaw (Poland)
  • 4. I. Frantsevich Institute for Problems of Materials Science of NASU, 3 Krzhyzhanovsky Street, 03680 Kiev (Ukraine)
  • 5. W. Trzebiatowski Institute of Low Temperature and Structure Research of PAS, P.O. Box 1410, 50-950 Wroclaw (Poland)

Description

High-quality HoB12, ErB12 and TmB12 single crystals with the fcc UB12 structure are grown; field dependencies of their magnetization are measured up to 14 T; angular dependences of the magnetization in the (1 0 0) and (1 1 0) planes are calculated, and properties of their Fermi surfaces (FS) are studied using the de Haas-van Alphen (dHvA) effect. The angular dependences of the dHvA frequencies in the (1 0 0) and (1 1 0) planes are obtained and values of their effective cyclotron masses are determined. The oscillation frequencies lie in the range (11.7-127.3)x102 T, and cyclotron masses within the range (0.4-1.45)m0. For ErB12 and TmB12, we found branches in the oscillation spectrum that originated from FS fragments with spins along and opposed to the field, and the energy of the exchange interaction is estimated. Its value for the γ-branch in ErB12 is equal to 8.2 meV, and for the γ-, β- and θ-branches in TmB12; these values are 14.5, 28.5, and 18.3 meV, respectively

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jmmm.2008.01.012

Additional details

Identifiers

DOI
10.1016/j.jmmm.2008.01.012;
PII
S0304-8853(08)00020-6;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
320
Journal Issue
9
Journal Page Range
p. 1597-1604
ISSN
0304-8853
CODEN
JMMMDC

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.