Published May 1999 | Version v1
Journal article

X-ray photoelectron spectroscopy: a powerful tool for a better characterization of thin film materials

  • 1. ICMCB-ENSCPB-BP108-33402 Talence cedex (France)
  • 2. L.P.C.M.-URA 5624-2 avenue du President Angot-64000 PAU (France)

Description

X-ray photoelectron spectroscopy (XPS) is one of the most powerful tools to characterize thin films materials. To illustrate the use of XPS, some examples will be given on materials used as positive electrode in micro batteries. XPS is also very useful for following the oxydo-reduction mechanisms occurring during the intercalation and the de-intercalation of lithium, corresponding respectively to the discharge and the charge of the battery. After strict identification of each species, the evolution of their binding energies could be followed very easily. The XPS analyses of oxysulfides thin films at different stages of their cycling process have shown apparently good efficiency of the oxygen-rich compositions. During the redox process, the results obtained have clearly shown the important contribution of the sulfur atoms besides the transition metal atom

Additional details

Publishing Information

Journal Title
Bulletin of Materials Science
Journal Volume
22
Journal Issue
3
Journal Page Range
p. 607-614
CODEN
BUMSDW

Conference

Title
5. international union of materials research societies - international conference in Asia
Acronym
IUMRS-ICA 98
Dates
Oct 1998
Place
Bangalore (India)

Optional Information

Notes
18 refs., 7 figs., 3 tabs.