Published September 2008
| Version v1
Journal article
Correction of XRF to content of element in irregular sample
- 1. Chengdu Univ. of Technology, Chengdu (China)
Description
A measurement of the content of determined element when the bottom area of sample can not be regarded as infinite is described. The ratio of characteristic to scatter is a parameter that is nothing with the bottom area of sample from theoretic. Experimentation proves that the method of characteristic/scattering ratio is a effective method to solve the measurement of content in irregular sample. (authors)
Additional details
Publishing Information
- Journal Title
- Nuclear Electronics and Detection Technology
- Journal Volume
- 28
- Journal Issue
- 5
- Journal Page Range
- p. 914, 961-964
- ISSN
- 0258-0934
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 41064684
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- CORRECTIONS; PARAMETRIC ANALYSIS; SCATTERING; SURFACE AREA; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; NONDESTRUCTIVE ANALYSIS; SURFACE PROPERTIES; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 2 figs., 6 tabs., 7 refs.