Atom beam triangulation of organic layers at 100 meV normal energy: self-assembled perylene on Ag(1 1 0) at room temperature
Description
Highlights: • A new technique to monitor on-line, the growth and organization of organic molecules. • Atom beam triangulation points directions where the molecules align to each other. • The contrast is given by the variation of the width of the scattering pattern. • It is non-destructive and detects early stages of the organization. • The system investigated is self-assembly of perylene on Ag(1 1 0) at room temperature. - Abstract: The controlled growth of organic layers on surfaces is still waiting for an in-situ reliable technique that would allow their quality to be monitored and improved. Here we show that the growth of a perylene monolayer deposited on Ag(1 1 0) at room temperature can be tracked with low energy atoms in a regime where the energy perpendicular to the layer is less than 0.1 eV and below the organic film damage threshold. The image processing required for this atom triangulation technique is described in detail.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2015.12.134Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2015.12.134;
- arXiv
- arXiv:1509.05549v2;
- PII
- S0169-4332(15)03139-6;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 364
- Journal Page Range
- p. 235-240
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48017642
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATOMS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; FILMS; IMAGE PROCESSING; IMAGES; LAYERS; MOLECULES; PERYLENE; SILVER; SURFACES; TEMPERATURE RANGE 0273-0400 K
- Descriptors DEC
- AROMATICS; CONDENSED AROMATICS; ELEMENTS; METALS; ORGANIC COMPOUNDS; PROCESSING; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.