Published February 28, 2016 | Version v1
Journal article

Atom beam triangulation of organic layers at 100 meV normal energy: self-assembled perylene on Ag(1 1 0) at room temperature

Description

Highlights: • A new technique to monitor on-line, the growth and organization of organic molecules. • Atom beam triangulation points directions where the molecules align to each other. • The contrast is given by the variation of the width of the scattering pattern. • It is non-destructive and detects early stages of the organization. • The system investigated is self-assembly of perylene on Ag(1 1 0) at room temperature. - Abstract: The controlled growth of organic layers on surfaces is still waiting for an in-situ reliable technique that would allow their quality to be monitored and improved. Here we show that the growth of a perylene monolayer deposited on Ag(1 1 0) at room temperature can be tracked with low energy atoms in a regime where the energy perpendicular to the layer is less than 0.1 eV and below the organic film damage threshold. The image processing required for this atom triangulation technique is described in detail.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2015.12.134

Additional details

Identifiers

DOI
10.1016/j.apsusc.2015.12.134;
arXiv
arXiv:1509.05549v2;
PII
S0169-4332(15)03139-6;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
364
Journal Page Range
p. 235-240
ISSN
0169-4332
CODEN
ASUSEE

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48017642
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ATOMS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; FILMS; IMAGE PROCESSING; IMAGES; LAYERS; MOLECULES; PERYLENE; SILVER; SURFACES; TEMPERATURE RANGE 0273-0400 K
Descriptors DEC
AROMATICS; CONDENSED AROMATICS; ELEMENTS; METALS; ORGANIC COMPOUNDS; PROCESSING; TEMPERATURE RANGE; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.