Published May 27, 2013
| Version v1
Journal article
Self-organized micro-holes on titania based sol-gel films under continuous direct writing with a continuous wave ultraviolet laser
- 1. University of Saint-Etienne, Jean Monnet, F-42000 Saint-Etienne (France)
- 2. CNRS, UMR 5516, Laboratoire Hubert Curien, 18 Rue Pr. Lauras F-42000 Saint-Etienne (France)
- 3. University of Lyon, F. 42023 Saint-Etienne (France)
- 4. Institut de Sciences des Matériaux de Mulhouse, CNRS UMR 7361, Université de Haute Alsace, 15 rue Jean Starcky, 68057 Mulhouse (France)
Description
The microstructuring of titania based sol-gel films is investigated by direct writing with a continuous wave ultraviolet laser beam emitting at 244 nm. Depending on the exposure conditions, the films exhibit a volume expansion, a volume shrinkage, a self-shaped delamination, or are damaged. This paper is mainly focused on the regime where spontaneous local delamination occurs, which corresponds to a narrow range of laser irradiances and writing speeds. In this regime, self-organized round-shape micro-holes opened on the substrate are generated.
Additional details
Identifiers
- DOI
- 10.1063/1.4807784;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 102
- Journal Issue
- 21
- Journal Page Range
- p. 211903-211903.4
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44117391
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BEAMS; CRYSTAL STRUCTURE; DAMAGE; EXPANSION; LASER MATERIALS; LASER RADIATION; MICROSTRUCTURE; RADIANT FLUX DENSITY; SHRINKAGE; SOL-GEL PROCESS; SUBSTRATES; THIN FILMS; TITANIUM OXIDES; ULTRAVIOLET RADIATION
- Descriptors DEC
- CHALCOGENIDES; ELECTROMAGNETIC RADIATION; FILMS; FLUX DENSITY; MATERIALS; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- (c) 2013 AIP Publishing LLC