Published June 1999 | Version v1
Journal article

Pulse-height defect in the passivated ion-implanted Si detectors of the INDRA array

Description

The pulse-height defect (PHD) of 36Ar, 58Ni, 129Xe, 181Ta and 197Au ions in the 180 passivated ion-implanted silicon detectors of the INDRA array has been measured. The detectors faced the target with the low electric field side. The charge encoding ensured a low ballistic deficit. Detectors with the same nominal characteristics and electric field strength show a PHD dependence on the individual silicon wafer. They are classified and calibrated by using an empirical parametrization which relates the PHD to the total energy through a Z-depending power law. A PHD analytical formula, based on a simple recombination model, is also proposed. It considers a realistic charge density variation with the position coordinate on the ion path. This new formula is successfully confronted to some experimental data

Additional details

Identifiers

PII
S0168900299001680;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
428
Journal Issue
2-3
Journal Page Range
p. 379-390
ISSN
0168-9002
CODEN
NIMAER

Optional Information

Copyright
Copyright (c) 1999 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.