Published November 1992 | Version v1
Journal article Metadata-only

Diagnostics for picosecond electron-beam bunch

Creators

  • 1. Academia Sinica, Beijing, BJ (China). Inst. of Atomic Energy

Description

A picosecond electron-beam bunch diagnostic method with a streak camera is introduced. Some preliminary experiments on the Beijing Electron and Positron Collider and the Beijing Free-Electron Laser Facility have used this system. The results are presented

Additional details

Publishing Information

Journal Title
High Power Laser and Particle Beams
Journal Volume
4
Journal Issue
4
Journal Page Range
p. 501-508.
ISSN
1001-4322
CODEN
QYLIEL

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
25029436
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S43: PARTICLE ACCELERATORS;
Descriptors DEI
BEAM BUNCHING; BEAM PROFILES; CHINA; DIAGNOSTIC TECHNIQUES; ELECTRON BEAMS; FREE ELECTRON LASERS; LINEAR ACCELERATORS; STORAGE RINGS; STREAK CAMERAS; TIME DEPENDENCE
Descriptors DEC
ACCELERATORS; AMPLIFIERS; ASIA; BEAM DYNAMICS; BEAMS; CAMERAS; DYNAMICS; EQUIPMENT; LASERS; LEPTON BEAMS; MECHANICS; PARTICLE BEAMS