Minimized OER overpotential via SILAR-based development of g-CN/CdS nanocomposite
Creators
- 1. State Key Laboratory for Mechanical Behavior of Materials, School of Material Science and Engineering, Xi'an Jiaotong University, 710049, Xi'an (China)
- 2. Department of Material Sciences and Engineering, Institute of Space Technology, 44000, Islamabad (Pakistan)
- 3. Institute of Chemical Sciences, Bahauddin Zakariya University, Multan (Pakistan)
Description
For the water-splitting process, it is essential to improve the search for low-cost, highly active materials that can catalyze the oxygen evolution reaction (OER). Based on this, the current work suggests a unique method for creating g-CN/CdS nanocomposite. The g-CN/CdS nanocomposite loaded on nickel foam (NF) required overpotential of 279.6 mV for the OER, which is higher than overpotentials required by g-CN and CdS for attaining desired standard current density of 10 mA cm under the same circumstances. Findings elucidate high activity of composite material through increased active sites with ECSA of 130 cm, very low charge-transfer resistance Rct value of 2.5 (Ω) and decreased tafel slope value of 44.5 mV dec. All these factors are accountable for the improved OER activity and faster reaction kinetics. The material was characterized through XRD, FTIR, SEM, EDS, and XPS techniques.
Additional details
Identifiers
Publishing Information
- Journal Title
- Applied Physics. A, Materials Science and Processing (Print)
- Journal Volume
- 129
- Journal Issue
- 12
- Journal Page Range
- vp.
- ISSN
- 0947-8396
- CODEN
- APAMFC
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 55034737
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CADMIUM SULFIDES; COMPOSITE MATERIALS; FOURIER TRANSFORM SPECTROMETERS; NANOCOMPOSITES; OXYGEN ENHANCEMENT RATIO; REACTION KINETICS; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; DIMENSIONLESS NUMBERS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; INORGANIC PHOSPHORS; KINETICS; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; NANOMATERIALS; PHOSPHORS; PHOTOELECTRON SPECTROSCOPY; SCATTERING; SPECTROMETERS; SPECTROSCOPY; SULFIDES; SULFUR COMPOUNDS
Optional Information
- Notes
- AID: 850