Published September 1980
| Version v1
Journal article
Sensitive photothermal deflection technique for measuring absorption in optically thin media
- 1. Laboratoire d'Optique Physique, E.R. 5 du CNRS, Ecole Superieure de Physique et de Chimie Industriells, 10, rue Vauquelin, 75231 Paris, Cedex 05, France
Description
A highly sensitive and simple photothermal scheme for determining optical absorptions in condensed-matter samples is presented. αl values as low as 10-7 and 10-8 were measured for thin films and coatings and for liquids, respectively. A comparison with the thermal lens effect is given, and the experimental factors limiting our sensitivity are discussed
Additional details
Publishing Information
- Journal Title
- Opt. Lett.
- Journal Volume
- 5
- Journal Issue
- 9
- Series
- Opt. Lett.
- Journal Page Range
- 377-379
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 12578333
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ABSORPTION; COATINGS; CORRELATIONS; ENERGY TRANSFER; FILMS; LASER RADIATION; LIQUIDS; MEASURING METHODS; SENSITIVITY
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; FLUIDS; RADIATIONS