Published June 15, 2008 | Version v1
Journal article

Orientation inhomogeneities within individual grains in cold-rolled aluminium resolved by electron backscatter diffraction

  • 1. Center for Fundamental Research: Metal Structures in Four Dimensions, Materials Research Department, Riso National Laboratory, Frederiksborgvej 399, 4000 Roskilde (Denmark)

Description

A recently developed scheme for evaluation of orientation data gathered by electron backscatter diffraction is employed on individual grains in a deformed state. The potential of the method is illustrated on aluminium cold-rolled to 38%. The orientation distribution in each grain is characterized by its anisotropy and the average orientation spread. The dependence of both parameters on grain size is discussed. The preferred rotation axes in each grain are determined and compared with macroscopic directions. From the disorientation angles with respect to the preferred rotation axis characteristic features of the deformation structure as alternating orientation differences or orientation gradients can be resolved

Availability note (English)

Available from http://dx.doi.org/10.1016/j.msea.2006.08.139

Additional details

Identifiers

DOI
10.1016/j.msea.2006.08.139;
PII
S0921-5093(07)00939-2;

Publishing Information

Journal Title
Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
Journal Volume
483-484
Journal Page Range
p. 668-671
ISSN
0921-5093
CODEN
MSAPE3

Conference

Title
14. international conference on the strength of materials
Dates
4-9 Jun 2006
Place
Xian (China)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40025525
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALUMINIUM; ANISOTROPY; BACKSCATTERING; DEFORMATION; DISTRIBUTION; ELECTRON DIFFRACTION; GRAIN SIZE; ORIENTATION; ROTATION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELEMENTS; METALS; MICROSTRUCTURE; MOTION; SCATTERING; SIZE

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.