Published April 1, 2018 | Version v1
Journal article

Shunt resistance and saturation current determination in CdTe and CIGS solar cells. Part 1: a new theoretical procedure and comparison with other methodologies

  • 1. Instituto Politécnico Nacional, ESFM, Departamento de Física, U.P.A.L.M., San Pedro Zacatenco, CDMX, 07738, México (Mexico)
  • 2. Instituto Politécnico Nacional, ESIQIE, Departamento de Ingeniería en Metalurgia y Materiales, U.P.A.L.M., San Pedro Zacatenco, CDMX, 07738, México (Mexico)
  • 3. Instituto Politécnico Nacional, ESCOM, Departamento de Formación Básica, U.P.A.L.M., San Pedro Zacatenco, CDMX, 07738, México (Mexico)

Description

A new proposal for the extraction of the shunt resistance (R sh) and saturation current (I sat) of a current-voltage (I–V) measurement of a solar cell, within the one-diode model, is given. First, the Cheung method is extended to obtain the series resistance (R s), the ideality factor (n) and an upper limit for I sat. In this article which is Part 1 of two parts, two procedures are proposed to obtain fitting values for R sh and I sat within some voltage range. These two procedures are used in two simulated I–V curves (one in darkness and the other one under illumination) to recover the known solar cell parameters R sh, R s, n, I sat and the light current I lig and test its accuracy. The method is compared with two different common parameter extraction methods. These three procedures are used and compared in Part 2 in the I–V curves of CdS-CdTe and CIGS-CdS solar cells. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1361-6641/aab017

Additional details

Identifiers

Publishing Information

Journal Title
Semiconductor Science and Technology
Journal Volume
33
Journal Issue
4
Journal Page Range
[14 p.]
ISSN
0268-1242
CODEN
SSTEET