Published June 3, 2009 | Version v1
Journal article Metadata-only

Construction and Test of Low Cost X-Ray Tomography Scanner for Physical-Chemical Analysis and Nondestructive Inspections

Creators

  • 1. Universidade de Sorocaba-UNISO, Campus Seminario, Caixa Postal 578, Av. Dr. Eugenio Salermo, 100, Centro, 18035-430, Sorocaba, SP (Brazil)
  • 2. Universidade Estadual Paulista Julio de Mesquita Filho-UNESP, GASI, Av. 3 de Marco, 511, Alto da Boa Vista, 18087-180, Sorocaba, SP (Brazil)

Description

X-ray computed tomography (CT) refers to the cross-sectional imaging of an object measuring the transmitted radiation at different directions. In this work, we describe the development of a low cost micro-CT X-ray scanner that is being developed for nondestructive testing. This tomograph operates using a microfocus X-ray source and contains a silicon photodiode as detectors. The performance of the system, by its spatial resolution, has been estimated through its Modulation Transfer Function-MTF and the obtained value at 10% of MTF is 661 μm. It was built as a general purpose nondestructive testing device.

Additional details

Identifiers

DOI
10.1063/1.3157786;

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1139
Journal Issue
1
Journal Page Range
p. 102-105
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
31. workshop on nuclear physics in Brazil
Dates
8-12 Sep 2008
Place
Sao Sebastiao, Sao Paulo (Brazil)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41060281
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHEMICAL ANALYSIS; COMPUTERIZED TOMOGRAPHY; MODULATION; NONDESTRUCTIVE TESTING; PERFORMANCE; PHOTODIODES; SILICON; SPATIAL RESOLUTION; TRANSFER FUNCTIONS; X RADIATION
Descriptors DEC
DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; ELEMENTS; FUNCTIONS; IONIZING RADIATIONS; MATERIALS TESTING; RADIATIONS; RESOLUTION; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMIMETALS; TESTING; TOMOGRAPHY

Optional Information

Notes
(c) 2009 American Institute of Physics