Published June 1, 1989 | Version v1
Journal article

The application of synchrotron radiation to X-ray multiple-diffraction studies

  • 1. General Electric Co. Ltd., Wembley (UK). Hirst Research Center
  • 2. Science and Engineering Research Council, Daresbury (UK). Daresbury Lab.
  • 3. Strathclyde Univ., Glasgow (UK). Dept. of Pure and Applied Chemistry

Description

Multiple diffraction using parallel-beam synchrotron X-radiation is described. Data recorded on the Daresbury Synchrotron Radiation Source from a single crystal of InSb are presented and compared with data recorded with the pseudo-Kossel technique. The wide-beam synchrotron technique has demonstrated for the first time the feasibility of the synchrotron-radiation multiple-diffraction topographic technique. Potential applications for this technique in the characterization of low-dimensional structures are outlined. (orig.)

Additional details

Publishing Information

Journal Title
Journal of Applied Crystallography
Journal Volume
22
Journal Issue
3
Series
J. Appl. Crystallogr.
Journal Page Range
201-204
ISSN
0021-8898
CODEN
JACGA