Published June 1, 1989
| Version v1
Journal article
The application of synchrotron radiation to X-ray multiple-diffraction studies
Creators
- 1. General Electric Co. Ltd., Wembley (UK). Hirst Research Center
- 2. Science and Engineering Research Council, Daresbury (UK). Daresbury Lab.
- 3. Strathclyde Univ., Glasgow (UK). Dept. of Pure and Applied Chemistry
Description
Multiple diffraction using parallel-beam synchrotron X-radiation is described. Data recorded on the Daresbury Synchrotron Radiation Source from a single crystal of InSb are presented and compared with data recorded with the pseudo-Kossel technique. The wide-beam synchrotron technique has demonstrated for the first time the feasibility of the synchrotron-radiation multiple-diffraction topographic technique. Potential applications for this technique in the characterization of low-dimensional structures are outlined. (orig.)
Additional details
Publishing Information
- Journal Title
- Journal of Applied Crystallography
- Journal Volume
- 22
- Journal Issue
- 3
- Series
- J. Appl. Crystallogr.
- Journal Page Range
- 201-204
- ISSN
- 0021-8898
- CODEN
- JACGA
INIS
- Country of Publication
- Denmark
- Country of Input or Organization
- Denmark
- INIS RN
- 21004032
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BRAGG REFLECTION; MULTIPLE SCATTERING; SYNCHROTRON RADIATION; TOPOGRAPHY; USES; X-RAY DIFFRACTION
- Descriptors DEC
- BREMSSTRAHLUNG; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; RADIATIONS; REFLECTION; SCATTERING