Optical design of the short pulse x-ray imaging and microscopy time-angle correlated diffraction beamline at the Advanced Photon Source
Creators
- 1. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
- 2. Department of Materials Science and Engineering, University of Wisconsin, Madison, Wisconsin 53706 (United States)
Description
The short pulse x-ray imaging and microscopy beamline is one of the two x-ray beamlines that will take full advantage of the short pulse x-ray source in the Advanced Photon Source (APS) upgrade. A horizontally diffracting double crystal monochromator which includes a sagittally focusing second crystal will collect most of the photons generated when the chirped electron beam traverses the undulator. A Kirkpatrick-Baez mirror system after the monochromator will deliver to the sample a beam which has an approximately linear correlation between time and vertical beam angle. The correlation at the sample position has a slope of 0.052 ps/μrad extending over an angular range of 800 μrad for a cavity deflection voltage of 2 MV. The expected time resolution of the whole system is 2.6 ps. The total flux expected at the sample position at 10 keV with a 0.9 eV energy resolution is 5.7 × 1012 photons/s at a spot having horizontal and vertical full width at half maximum of 33 μm horizontal by 14 μm vertical. This new beamline will enable novel time-dispersed diffraction experiments on small samples using the full repetition rate of the APS.
Additional details
Identifiers
- DOI
- 10.1063/1.4804197;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 84
- Journal Issue
- 5
- Journal Page Range
- p. 053103-053103.7
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44075184
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- ADVANCED PHOTON SOURCE; APPROXIMATIONS; CRYSTALS; DIFFRACTION; ELECTRON BEAMS; ENERGY RESOLUTION; MICROSCOPY; MONOCHROMATORS; PHOTONS; PULSES; TIME RESOLUTION; X RADIATION; X-RAY SOURCES
- Descriptors DEC
- BEAMS; BOSONS; CALCULATION METHODS; COHERENT SCATTERING; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; IONIZING RADIATIONS; LEPTON BEAMS; MASSLESS PARTICLES; PARTICLE BEAMS; RADIATION SOURCES; RADIATIONS; RESOLUTION; SCATTERING; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES; TIMING PROPERTIES
Optional Information
- Notes
- (c) 2013 AIP Publishing LLC