Published 2008
| Version v1
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Diffraction Data and Microstructure of Al2O3 - SiO2 Coatings
Creators
- 1. Institute of Atomic Energy, Otwock-Swierk (Poland)
- 2. Institute of Metallurgy and Material Science, PAS, Cracow (Poland)
Description
no abstract available
Files
39101921.pdf
Files
(54.0 kB)
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Additional details
Publishing Information
- Imprint Place
- Otwock-Swierk (Poland)
- Imprint Title
- Annual Report 2007
- Imprint Pagination
- 141 p.
- Journal Page Range
- p. 70
- ISSN
- 1507-5478
- Report number
- INIS-PL--2008-0014
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 39101921
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Progress Report
- Descriptors DEI
- ALUMINIUM OXIDES; COATINGS; COMPOSITE MATERIALS; CRYSTAL STRUCTURE; MICROSTRUCTURE; PROGRESS REPORT; SILICON OXIDES; THERMAL INSULATION; X-RAY DIFFRACTION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; DOCUMENT TYPES; MATERIALS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SILICON COMPOUNDS
Optional Information
- Notes
- 4 refs., 2 figs.