Published March 2007
| Version v1
Journal article
Neutron diffraction studies on pseudobinary compounds Cr1-xRuxSb2 (x=0.05 and 0.2)
Creators
- 1. Faculty of Engineering, Tohoku Gakuin University, Tagajo 985-8537 (Japan)
- 2. Institute for Materials Research, Tohoku University, Sendai 980-8577 (Japan)
Description
Neutron diffraction measurements were carried out for pseudobinary compounds Cr1-xRuxSb2 (x=0.05 and 0.2) with a Marcasite-type structure at temperatures from 15 to 260K. The results show that (1) their magnetic structures are antiferromagnetic ones in which the magnetic unit cell requires a doubling of the b- and c-axes of the orthorhombic chemical cell and (2) both magnetic moment and the Neel temperature decrease with x and appear to be zero around x=0.4. The results are discussed comparing with those for the compounds Cr1-xFexSb2
Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2006.10.597;
- PII
- S0304-8853(06)01818-X;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 310
- Journal Issue
- 2
- Journal Page Range
- p. 1569-1571
- ISSN
- 0304-8853
- CODEN
- JMMMDC
Conference
- Title
- 17. international conference on magnetism
- Dates
- 20-25 Aug 2006
- Place
- Kyoto (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39029813
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANTIFERROMAGNETISM; ANTIMONIDES; CHROMIUM COMPOUNDS; MAGNETIC MOMENTS; MARCASITE; NEEL TEMPERATURE; NEUTRON DIFFRACTION; ORTHORHOMBIC LATTICES; RUTHENIUM COMPOUNDS
- Descriptors DEC
- ANTIMONY COMPOUNDS; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; MAGNETISM; MINERALS; PHYSICAL PROPERTIES; PNICTIDES; REFRACTORY METAL COMPOUNDS; SCATTERING; SULFIDE MINERALS; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS; TRANSITION TEMPERATURE
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.