Published February 2012 | Version v1
Journal article Metadata-only

The basic discussion of the application of ion collection method measuring α particles in the α surface contamination measurement

Creators

  • 1. China Institute for Radiation Protectino, Taiyuan (China)

Description

It mainly deals with the theory of particle measurement in a method of ion collection and probes the prospect of its application in alpha surface contamination measurement. (authors)

Additional details

Publishing Information

Journal Title
Nuclear Electronics and Detection Technology
Journal Volume
32
Journal Issue
2
Journal Page Range
p. 210-212
ISSN
0258-0934

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
46041440
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ALPHA DETECTION; ALPHA PARTICLES; PROBES; SURFACE CONTAMINATION
Descriptors DEC
CHARGED PARTICLE DETECTION; CHARGED PARTICLES; CONTAMINATION; DETECTION; IONIZING RADIATIONS; RADIATION DETECTION; RADIATIONS

Optional Information

Notes
7 figs., 8 refs.