Published November 1, 2012 | Version v1
Journal article

The modification of LiTaO3 crystal by low-energy He-ion implantation

  • 1. Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000 (China)
  • 2. University of Chinese Academy of Sciences, Beijing 100049 (China)

Description

Highlights: ► LiTaO3 crystal was implanted by 250 keV He+. ► We report the surface and transmittance of LiTaO3 change with the fluence and time. ► New phenomena (self-splitting, self-exfoliation, self-recovery) occurred. ► Evolvement of defects and the behavior of helium were discussed. - Abstract: The effects of He-ion implantation on the surface morphology and transmittance of LiTaO3 single crystals are investigated. The samples were implanted with 250 keV He-ion at different fluences at room temperature. The results show that the surface morphology and transmittance of implanted samples strongly depend on the ion fluence and the time when the samples expose to the air up to 60 days. When the fluence is above 1.0 × 1016 He+/cm2, the transmission spectra indicate that a high concentration of defects is created. 3D-profile images show that at the higher fluence a great many triangular stripes appear on the surface of the samples. After 60 days, the recovery of the transmittance occurs and varies with the fluence. For the sample at the fluence of 5.0 × 1016 He+/cm2, the raised stripes on the surface evolve into narrow cracks. Regional exfoliation, however, occurs on the surface of the sample with the fluence of 1.0 × 1017 He+/cm2. According to the experimental results and simulation of SRIM 2008 code, the evolvement of defects and the behavior of He are discussed.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2012.09.003

Additional details

Identifiers

DOI
10.1016/j.nimb.2012.09.003;
PII
S0168-583X(12)00531-9;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
290
Journal Page Range
p. 54-58
ISSN
0168-583X
CODEN
NIMBEU

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.