Published 1972 | Version v1
Book Metadata-only

An electron optical 400 kV system for testing a superconducting lens

Creators

  • 1. Siemens A.G., Munich (F.R. Germany)

Description

no abstract available

Additional details

Publishing Information

Publisher
Institute of Physics.
Imprint Place
London
ISBN
854981047
Imprint Title
Electron microscopy 1972
Imprint Pagination
p. 120-121.
Journal Issue
no. 9
Series
Institute of Physics conference series.

Conference

Title
5. European congress on electron microscopy.
Dates
5 Sep 1972.
Place
Manchester, UK.

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
4046030
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALIGNMENT; BEAM OPTICS; CRYOSTATS; ELECTROMAGNETIC LENSES; ELECTRON BEAMS; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONS; FOCUSING; OPTICAL SYSTEMS; RESOLUTION; SUPERCONDUCTIVITY; SUPERCONDUCTORS
Descriptors DEC
BEAMS; CONTROL EQUIPMENT; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTARY PARTICLES; FERMIONS; LENSES; LEPTON BEAMS; LEPTONS; MICROSCOPES; MICROSCOPY; PARTICLE BEAMS; PHYSICAL PROPERTIES; THERMOSTATS