Published February 25, 2011 | Version v1
Journal article

Refining of metallurgical silicon by directional solidification

  • 1. Department of Metallurgical and Materials Engineering, University of Sao Paulo, Av. Prof. Mello Moraes, 2463 Sao Paulo-SP, 05508-900 (Brazil)
  • 2. Laboratory of Metallurgy and Ceramics Materials, Institute for Technological Research, Av. Prof. Almeida Prado, 532, Sao Paulo-SP, 05508-901 (Brazil)

Description

The directional solidification of a typical and a previously refined metallurgical silicon was carried out in a vertical Bridgman furnace. The mold velocity out of the hot zone of the furnace changed from one experiment to another in the range between 5 and 110 μm s-1. Samples were extracted from the cylindrical ingots obtained in the experiments to investigate the effects of the mold velocity on the micro and macrostructures and on the concentration profiles of impurities along the ingots. At the lowest mold velocity, the macrostructures consist of columnar grains oriented approximately parallel to the ingot axis. As velocity increases, grains become thinner and more inclined in the radial direction. Precipitated particles containing Si, Fe, Al, and Ti are observed at the top of all ingots and, as the mold velocity increases, they are also seen at the ingot bottom and middle. The concentration profiles of several impurities have been measured along the ingots by inductively coupled plasma atomic emission spectrometry (ICP), indicating an accumulation of impurities at the ingot top. Consequently, the bottom and middle of the ingots are purer than the corresponding metallurgical silicon from which they solidified. Slices from the ingot bottom have also been analyzed by the glow discharge mass spectrometry technique (GDMS), allowing measurement of impurity concentrations that were below the quantification limit of the ICP. The purification effect and the accumulation of impurities at the ingot top are more pronounced as the mold velocity decreases. In the ingots obtained from the typical metallurgical silicon at the lowest mold velocities (5 and 10 μm s-1), except for Al, all impurities are in concentrations below an important maximum limit for the feedstock of solar grade silicon. At the same mold velocities, the concentrations of Fe, Ti, Cu, Mn, and Ni measured at the bottom of the ingots obtained from both types of metallurgical silicon (typical and previously refined) are even below some limits suggested directly for solar grade silicon.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.mseb.2010.11.010

Additional details

Identifiers

DOI
10.1016/j.mseb.2010.11.010;
PII
S0921-5107(10)00649-5;

Publishing Information

Journal Title
Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
Journal Volume
176
Journal Issue
3
Journal Page Range
p. 217-226
ISSN
0921-5107
CODEN
MSBTEK

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43030551
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
BUILDUP; CYLINDRICAL CONFIGURATION; EMISSION SPECTROSCOPY; FUNGI; FURNACES; GLOW DISCHARGES; IMPURITIES; MASS SPECTROSCOPY; PARTICLES; PLASMA; PURIFICATION; SILICON; SOLIDIFICATION; VELOCITY
Descriptors DEC
CONFIGURATION; ELECTRIC DISCHARGES; ELEMENTS; PHASE TRANSFORMATIONS; PLANTS; SEMIMETALS; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.