Published 1984
| Version v1
Book
Applications of a multi-window detector during routine energy-dispersive x-ray analysis
Creators
- 1. Materials and Structures Dept., Royal Aircraft Establishment, Farnborough, GU14 6TD
Description
Some results of user experience on the detection of light elements by a multi-window detector are presented. They are offered as a guide to how readily one can detect light elements in practical situations; i.e., in ''real'' materials that can be complex, inhomogeneous, sometimes present as thin films, and often nonconducting. At this stage the analyses are only qualitative, but it is anticipated that future work will include attempts at quantitative analysis
Additional details
Publishing Information
- Publisher
- The San Francisco Press Inc.
- Imprint Place
- San Francisco, CA (USA)
- Imprint Title
- Analytical electron microscopy
- Journal Page Range
- p. 369-372.
Conference
- Title
- Microbeam Analysis Society analytical electron microscopy meeting.
- Dates
- 16-20 Jul 1984.
- Place
- Bethlehem, PA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 18059871
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ELEMENTS; EXPERIMENTAL DATA; MATERIALS; QUALITATIVE CHEMICAL ANALYSIS; QUANTITATIVE CHEMICAL ANALYSIS; RADIATION DETECTORS; RESEARCH PROGRAMS; THIN FILMS; WINDOWS; X-RAY EMISSION ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; DATA; FILMS; INFORMATION; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; NUMERICAL DATA; OPENINGS