Published 1984 | Version v1
Book

Applications of a multi-window detector during routine energy-dispersive x-ray analysis

  • 1. Materials and Structures Dept., Royal Aircraft Establishment, Farnborough, GU14 6TD

Description

Some results of user experience on the detection of light elements by a multi-window detector are presented. They are offered as a guide to how readily one can detect light elements in practical situations; i.e., in ''real'' materials that can be complex, inhomogeneous, sometimes present as thin films, and often nonconducting. At this stage the analyses are only qualitative, but it is anticipated that future work will include attempts at quantitative analysis

Additional details

Publishing Information

Publisher
The San Francisco Press Inc.
Imprint Place
San Francisco, CA (USA)
Imprint Title
Analytical electron microscopy
Journal Page Range
p. 369-372.

Conference

Title
Microbeam Analysis Society analytical electron microscopy meeting.
Dates
16-20 Jul 1984.
Place
Bethlehem, PA (USA).