Published September 1992
| Version v1
Journal article
Set up of total reflection X-ray fluorescence (TRXF) analysis technique-investigation of the method of improving detection sensitivity
Creators
- 1. Academia Sinica, Lanzhou, GS (China). Inst. of Modern Physics
Description
TRXF is rather a new technique and has high sensitivity. In the experiment, the effect of Compton for the background of spectrum, the condition of total reflection in the situation of single reflector and double reflector are investigated, also some experiment results of TRXE analysis excited by X-ray tube are shown in the paper. Conclusion are that the Compton background is reduced efficiently, total reflection condition is set up and the sensitivity of detection reaches the level of ppb
Additional details
Publishing Information
- Journal Title
- Nuclear Electronics and Detection Technology
- Journal Volume
- 12
- Journal Issue
- suppl.
- Journal Page Range
- p. 386-389, 392.
- ISSN
- 0258-0934
- CODEN
- HDYUEC
Conference
- Title
- 6. national conference on nuclear electronic and nuclear detection technology (B).
- Dates
- 21-26 Sep 1992.
- Place
- Weihai (China).
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 26000025
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BACKGROUND RADIATION; COMPTON EFFECT; ORES; REFLECTION; SENSITIVITY; WATER; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- BASIC INTERACTIONS; CHEMICAL ANALYSIS; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; HYDROGEN COMPOUNDS; INTERACTIONS; NONDESTRUCTIVE ANALYSIS; OXYGEN COMPOUNDS; RADIATIONS; SCATTERING; X-RAY EMISSION ANALYSIS