Published June 2013
| Version v1
Journal article
Droop improvement in blue InGaN light-emitting diodes with GaN/InGaN superlattice barriers
Creators
- 1. Institute of Opto-electronic Materials and Technology, South China Normal University, Guangzhou 510631 (China)
Description
GaN/InGaN superlattice barriers are used in InGaN-based light-emitting diodes (LEDs). The electrostatic field in the quantum wells, electron hole wavefunction overlap, carrier concentration, spontaneous emission spectrum, light-current performance curve, and internal quantum efficiency are numerically investigated using the APSYS simulation software. It is found that the structure with GaN/InGaN superlattice barriers shows improved light output power, and lower current leakage and efficiency droop. According to our numerical simulation and analysis, these improvements in the electrical and optical characteristics are mainly attributed to the alleviation of the electrostatic field in the active region
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-1056/22/6/068505Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics. B
- Journal Volume
- 22
- Journal Issue
- 6
- Journal Page Range
- [5 p.]
- ISSN
- 1674-1056
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45031961
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CHARGE CARRIERS; COMPUTERIZED SIMULATION; CONCENTRATION RATIO; DIFFUSION BARRIERS; ELECTRICAL PROPERTIES; EMISSION SPECTRA; GALLIUM NITRIDES; HOLES; INDIUM COMPOUNDS; INTERFACES; LEAKAGE CURRENT; LIGHT EMITTING DIODES; OPTICAL PROPERTIES; QUANTUM EFFICIENCY; QUANTUM WELLS; SUPERLATTICES; VISIBLE RADIATION; WAVE FUNCTIONS
- Descriptors DEC
- CURRENTS; DIMENSIONLESS NUMBERS; EFFICIENCY; ELECTRIC CURRENTS; ELECTROMAGNETIC RADIATION; FUNCTIONS; GALLIUM COMPOUNDS; NANOSTRUCTURES; NITRIDES; NITROGEN COMPOUNDS; PHYSICAL PROPERTIES; PNICTIDES; RADIATIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SIMULATION; SPECTRA