Published May 1996
| Version v1
Journal article
Calculation of near-threshold O- photodetachment, including fine-structure effects
Creators
- 1. Department of Physics and JILA, University of Colorado, Boulder, Colorado 80309-0440 (United States)
Description
The photodetachment cross section of the O-(2p52Po) ground state is studied near the O(2p43Pjc) fine-structure thresholds, using the eigenchannel R-matrix method, multichannel quantum-defect theory, and the recoupling frame transformation. We find that the cross section increases monotonically with energy near the lowest detachmnet thresholds, in contrast to the Se- photodetachment cross section studied earlier. Our calculations, which are based on ab initio methods to obtain multichannel scattering parameters, explain the near-threshold features in the O- photodetachment cross section observed in an earlier experiment. copyright 1996 The American Physical Society
Additional details
Publishing Information
- Journal Title
- Physical Review. A
- Journal Volume
- 53
- Journal Issue
- 5
- Journal Page Range
- p. 3247-3252.
- ISSN
- 1050-2947
- CODEN
- PLRAAN
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27078783
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- EIGENSTATES; ELECTRON DETACHMENT; FINE STRUCTURE; GROUND STATES; OXYGEN; OXYGEN IONS; PHOTON-ION COLLISIONS; SELENIUM IONS
- Descriptors DEC
- CHARGED PARTICLES; COLLISIONS; ELEMENTS; ENERGY LEVELS; ION COLLISIONS; IONS; NONMETALS; PHOTON COLLISIONS