A vibration analysis of a cracked micro-cantilever in an atomic force microscope by using transfer matrix method
Creators
- 1. Department of Mechanical Engineering, Shahrood branch, Islamic Azad University, Shahrood (Iran, Islamic Republic of)
Description
Highlights: • Investigation of the effect of a crack in micro-cantilever of an atomic force microscope (AFM) on natural frequencies and sensitivities. • Obtaining the characteristic equation using the transfer matrix method. • The possibility of analyzing a multi-cracked cantilever applying the transfer matrix method. • The advantages of a cracked micro-cantilever in performance of the AFM. -- Abstract: In this paper, the effects of crack size and its location have been investigated on the free vibration of an atomic force microscopy (AFM) cantilever applying transfer matrix method. By modeling the crack as a torsional spring and considering the boundary conditions at the contact point with sample's surface, the AFM cantilever vibration behavior has been formulated. Afterwards, the characteristic equation has been derived applying the transfer matrix. At the end, the effects of crack size and its location have been investigated on the flexural resonant frequency and sensitivity of the AFM cantilever. The results indicate that the frequency and sensitivity would be maximum when the crack is approximately in the middle of the cantilever. Growing the crack size can result in the variations of either resonant frequency or sensitivity especially for more stiff samples.
Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2018.09.014;
- PII
- S0304399117302279;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 196
- Journal Page Range
- p. 33-39
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55044174
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; BOUNDARY CONDITIONS; COMPUTERIZED SIMULATION; MATRICES; MICROSCOPES; PERFORMANCE; SENSITIVITY; SURFACES; TRANSFER MATRIX METHOD
- Descriptors DEC
- CALCULATION METHODS; MICROSCOPY; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2018 Elsevier B.V. All rights reserved.