Published June 1990 | Version v1
Journal article

Parameterization of the scatter response function in SPECT imaging using Monte Carlo simulation

  • 1. Dept. of Radiology and Curriculum in Biomedical Engineering, Univ. of North Carolina at Chapel Hill, CB 7575 Chapel Hill, NC (USA)

Description

In the single photon emission computed tomography (SPECT), scattered radiation results in a loss of image contrast, spatial resolution and quantitative accuracy. In order to compensate accurately for these effects, the scatter response function (SRF) must be known. However, due to the incoherent nature of scatter radiation and the complex dependence of the SRF on many physical and imaging parameters, including primary photon energy, energy resolution and energy window of the detection system, the distribution and configuration of the radioactive sources, and the composition and geometry of the scattering medium, it is difficult to derive an analytic expression for the SRF. The authors have generated SRFs using the Monte Carlo simulation method and investigated the characteristics of the scattered radiation by fitting the SRFs with fitting functions. The parameters of the fitting functions were studied as a function of source position in a water filled cylindrical phantom with circular cross section. The parameterization of the SRF provides insight into the spatial distribution of detected scattered radiation in SPECT and is useful in developing methods to compensate for its effects in order to improve both the quality and quantitative accuracy of SPECT images

Additional details

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
37
Journal Issue
3
Series
IEEE Trans. Nucl. Sci.
Journal Page Range
1308-1315
ISSN
0018-9499
CODEN
IETNA

Conference

Title
Institute for Electronic and Electrical Engineers (IEEE) nuclear science symposium.
Dates
15-19 Jan 1990.
Place
San Francisco, CA (USA).

Optional Information

Secondary number(s)
CONF-900143--.