Published 1984 | Version v1
Journal article Metadata-only

On possibility of development of the multi-channel system of CsI(Tl)+pCu2Se(S)-nddSe(S) combined detectors for X-ray computerized tomography

Creators

  • 1. Vsesoyuznyj Nauchno-Issledovatel'skij Inst. Istochnikov Toka, Moscow (USSR)
  • 2. AN Ukrainskoj SSR, Kiev. Inst. Poluprovodnikov

Description

Properties of developed combined detectors comprising scintillation monocrystals CsJ(Tl) and thin-film semiconductor photodetectors on the base of pCu2Se(S)-nCdSe(S) type heterojunctions have been studied, and parameters of the abovesaid detectors have been measured. The devices are found to have high operation parameters (noise factor >=0.8, differential non-linearity <=2%, time constant approximately 10-4 s) and can be used for developing a multielement matrix of combined detectors for X-ray computerized tomography

Additional details

Additional titles

Original title (Russian)
О возможности создания многоканальной системы комбинированных детекторов CsI(Тл)+пcу

Publishing Information

Journal Title
Defektoskopiya
Journal Issue
no.2
Series
Defektoskopiya.
ISSN
0130-3082

INIS

Country of Publication
Russian Federation
Country of Input or Organization
USSR
INIS RN
16015107
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
COMPUTERIZED TOMOGRAPHY; FLOWSHEETS; JUNCTION DETECTORS; MULTI-CHANNEL ANALYZERS; PERFORMANCE TESTING; SEMICONDUCTOR JUNCTIONS; SOLID SCINTILLATION DETECTORS; SPECIFICATIONS; X-RAY DETECTION
Descriptors DEC
DETECTION; DIAGNOSTIC TECHNIQUES; DIAGRAMS; ELECTRONIC EQUIPMENT; EQUIPMENT; INFORMATION; MEASURING INSTRUMENTS; PULSE ANALYZERS; RADIATION DETECTION; RADIATION DETECTORS; SCINTILLATION COUNTERS; SEMICONDUCTOR DETECTORS; TESTING; TOMOGRAPHY

Optional Information

Notes
For English translation see the journal Soviet Journal of Nondestructive Testing (USA).