Published August 2011 | Version v1
Journal article

Electrically tunable sign of capacitance in planar W-doped vanadium dioxide micro-switches

  • 1. INRS-Energie, Materiaux et Telecommunications, 1650 Lionel Boulet, Varennes, QC, J3X 1S2 (Canada)
  • 2. Departement de Physique, Universite de Montreal, Montreal, QC, H3C 3J7 (Canada)

Description

Negative capacitance (NC) in a planar W-doped VO2 micro-switch was observed at room temperature in the low-frequency range 1 kHz-10 MHz. The capacitance changed from positive to negative values as the W-doped VO2 active layer switched from semiconducting to metallic state under applied voltage. In addition, a capacitance-voltage hysteresis was observed as the applied voltage was cycled from -35 to 35 V. These observations suggest that NC results from the increase of the electrically induced conductivity in the active layer. This NC phenomenon could be exploited in advanced multifunctional devices including ultrafast switches, field-effect transistors and memcapacitive systems.

Availability note (English)

Available from http://dx.doi.org/10.1088/1468-6996/12/4/045002

Additional details

Publishing Information

Journal Title
Science and Technology of Advanced Materials
Journal Volume
12
Journal Issue
4
Journal Page Range
[6 p.]
ISSN
1468-6996

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43012930
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CAPACITANCE; DOPED MATERIALS; FIELD EFFECT TRANSISTORS; HYSTERESIS; KHZ RANGE; VANADIUM OXIDES
Descriptors DEC
CHALCOGENIDES; ELECTRICAL PROPERTIES; FREQUENCY RANGE; MATERIALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SEMICONDUCTOR DEVICES; TRANSISTORS; TRANSITION ELEMENT COMPOUNDS; VANADIUM COMPOUNDS