Published 1974
| Version v1
Report
Radiation damage in Ge(Li) detectors
Description
no abstract available
Additional details
Publishing Information
- Imprint Pagination
- 278 p.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 6191247
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Thesis, Non-conventional Literature
- Descriptors DEI
- ANNEALING; ENERGY RESOLUTION; GAMMA DETECTION; LEAKAGE CURRENT; LI-DRIFTED GE DETECTORS; NEUTRONS; PHYSICAL RADIATION EFFECTS
- Descriptors DEC
- BARYONS; CURRENTS; ELECTRIC CURRENTS; ELEMENTARY PARTICLES; FERMIONS; GE SEMICONDUCTOR DETECTORS; HADRONS; HEAT TREATMENTS; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; NUCLEONS; RADIATION DETECTION; RADIATION DETECTORS; RADIATION EFFECTS; RESOLUTION; SEMICONDUCTOR DETECTORS
Optional Information
- Notes
- University Microfilms Order No. 75-4679.