Published March 5, 2010
| Version v1
Journal article
Sub-100 nm silicon nanowires by laser interference lithography and metal-assisted etching
- 1. Max Planck Institute of Microstructure Physics, Weinberg 2, 06120 Halle (Germany)
Description
By combining laser interference lithography and metal-assisted etching we were able to produce arrays of silicon nanowires with uniform diameters as small as 65 nm and densities exceeding 2 x 107 mm-2. The wires are single crystalline, vertically aligned, arranged in a square pattern and obey strict periodicity over several cm2. The applied technique allows for a tailoring of nanowire size and density. Using a controlled and scalable process to fabricate sub-100 nm silicon nanowires is an important step towards the realization of cost-effective electronic and thermoelectric devices.
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/21/9/095302Additional details
Identifiers
- DOI
- 10.1088/0957-4484/21/9/095302;
- PII
- S0957-4484(10)36968-6;
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 21
- Journal Issue
- 9
- Journal Page Range
- [5 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43022200
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- DENSITY; ETCHING; INTERFERENCE; LASERS; METALS; MONOCRYSTALS; PERIODICITY; QUANTUM WIRES; SILICON
- Descriptors DEC
- CRYSTALS; ELEMENTS; NANOSTRUCTURES; PHYSICAL PROPERTIES; SEMIMETALS; SURFACE FINISHING; VARIATIONS