Published March 5, 2010 | Version v1
Journal article

Sub-100 nm silicon nanowires by laser interference lithography and metal-assisted etching

  • 1. Max Planck Institute of Microstructure Physics, Weinberg 2, 06120 Halle (Germany)

Description

By combining laser interference lithography and metal-assisted etching we were able to produce arrays of silicon nanowires with uniform diameters as small as 65 nm and densities exceeding 2 x 107 mm-2. The wires are single crystalline, vertically aligned, arranged in a square pattern and obey strict periodicity over several cm2. The applied technique allows for a tailoring of nanowire size and density. Using a controlled and scalable process to fabricate sub-100 nm silicon nanowires is an important step towards the realization of cost-effective electronic and thermoelectric devices.

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/21/9/095302

Additional details

Identifiers

DOI
10.1088/0957-4484/21/9/095302;
PII
S0957-4484(10)36968-6;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
21
Journal Issue
9
Journal Page Range
[5 p.]
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43022200
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
DENSITY; ETCHING; INTERFERENCE; LASERS; METALS; MONOCRYSTALS; PERIODICITY; QUANTUM WIRES; SILICON
Descriptors DEC
CRYSTALS; ELEMENTS; NANOSTRUCTURES; PHYSICAL PROPERTIES; SEMIMETALS; SURFACE FINISHING; VARIATIONS