Impact of x-ray dose on track formation and data analysis for CR-39-based proton diagnostics
Creators
- 1. Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States)
- 2. State University of New York at Geneseo, Geneseo, New York 14454 (United States)
- 3. Rochester Institute of Technology, Rochester, New York 14623 (United States)
Description
The nuclear track detector CR-39 is used extensively for charged particle diagnosis, in particular proton spectroscopy, at inertial confinement fusion facilities. These detectors can absorb x-ray doses from the experiments in the order of 1–100 Gy, the effects of which are not accounted for in the previous detector calibrations. X-ray dose absorbed in the CR-39 has previously been shown to affect the track size of alpha particles in the detector, primarily due to a measured reduction in the material bulk etch rate [Rojas-Herrera et al., Rev. Sci. Instrum. 86, 033501 (2015)]. Similar to the previous findings for alpha particles, protons with energies in the range 0.5–9.1 MeV are shown to produce tracks that are systematically smaller as a function of the absorbed x-ray dose in the CR-39. The reduction of track size due to x-ray dose is found to diminish with time between exposure and etching if the CR-39 is stored at ambient temperature, and complete recovery is observed after two weeks. The impact of this effect on the analysis of data from existing CR-39-based proton diagnostics on OMEGA and the National Ignition Facility is evaluated and best practices are proposed for cases in which the effect of x rays is significant
Additional details
Identifiers
- DOI
- 10.1063/1.4938161;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 86
- Journal Issue
- 12
- Journal Page Range
- p. 123511-123511.10
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47052627
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALPHA PARTICLES; AMBIENT TEMPERATURE; CALIBRATION; DATA ANALYSIS; ETCHING; INERTIAL CONFINEMENT; MEV RANGE 01-10; PROTONS; SPECTROSCOPY; US NATIONAL IGNITION FACILITY; X RADIATION
- Descriptors DEC
- BARYONS; CHARGED PARTICLES; CONFINEMENT; DATA PROCESSING; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; HADRONS; IONIZING RADIATIONS; MEV RANGE; NUCLEONS; PLASMA CONFINEMENT; PROCESSING; RADIATIONS; SURFACE FINISHING
Optional Information
- Notes
- (c) 2015 AIP Publishing LLC