Development of X-ray and ion diagnostic methods for plasma focus research
Description
A review of experimental methods used for investigation of X-rays and ion-beams emmited from plasma focus facilities is presented. The research program has been realized at the Institute for Nuclear Studies in Swierk and at the Institut fuer Plasmaforschung in Stuttgart, within the frames of an international co-operation. The studies on ion emission from different PF facilities are reviewed. The application of CN-films with Al-filters and of different ion-pinhole cameras is described. The use of a Thomson mass-spectrometer adopted for plasma studies is presented. The time-resolved measurements combined with a simultaneous mass- and energy-analysis of the ion beams are also described. The most important results of these studies are summarized. Particular attention is also paid to the studies of the X-ray emission. The use of stereoscopic sets of vacuum pinhole cameras with thin Be-filters is described. The application of X-ray pinhole cameras equipped with miniature scintillators for time-resolved measurements is also presented. The most important results of the X-ray emission studies are summarized. 35 refs., 12 figs. (author)
Availability note (English)
MF available from INIS under the Report Number.Files
21012071.pdf
Files
(483.3 kB)
| Name | Size | Download all |
|---|---|---|
|
md5:f3c3d1ef107282302b7186c497e06c4a
|
483.3 kB | Preview Download |
Additional details
Publishing Information
- Imprint Pagination
- 24 p.
- Report number
- IPJ--2037/P-5/PP/A
Conference
- Title
- The Polish - Rumanian plasma focus seminar.
- Dates
- 17-21 Nov 1986.
- Place
- Bucharest (Romania).
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 21012071
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- CAMERAS; EXPERIMENTAL DATA; FILMS; ION BEAMS; MASS SPECTROMETERS; PLASMA FOCUS DEVICES; RESEARCH PROGRAMS; TIME RESOLUTION; X RADIATION
- Descriptors DEC
- BEAMS; DATA; ELECTROMAGNETIC RADIATION; INFORMATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; NUMERICAL DATA; OPEN PLASMA DEVICES; RADIATIONS; RESOLUTION; SPECTROMETERS; THERMONUCLEAR DEVICES; TIMING PROPERTIES
Optional Information
- Notes
- Received in 1988.