Published December 1986 | Version v1
Report Open

Development of X-ray and ion diagnostic methods for plasma focus research

Description

A review of experimental methods used for investigation of X-rays and ion-beams emmited from plasma focus facilities is presented. The research program has been realized at the Institute for Nuclear Studies in Swierk and at the Institut fuer Plasmaforschung in Stuttgart, within the frames of an international co-operation. The studies on ion emission from different PF facilities are reviewed. The application of CN-films with Al-filters and of different ion-pinhole cameras is described. The use of a Thomson mass-spectrometer adopted for plasma studies is presented. The time-resolved measurements combined with a simultaneous mass- and energy-analysis of the ion beams are also described. The most important results of these studies are summarized. Particular attention is also paid to the studies of the X-ray emission. The use of stereoscopic sets of vacuum pinhole cameras with thin Be-filters is described. The application of X-ray pinhole cameras equipped with miniature scintillators for time-resolved measurements is also presented. The most important results of the X-ray emission studies are summarized. 35 refs., 12 figs. (author)

Availability note (English)

MF available from INIS under the Report Number.

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Additional details

Publishing Information

Imprint Pagination
24 p.
Report number
IPJ--2037/P-5/PP/A

Conference

Title
The Polish - Rumanian plasma focus seminar.
Dates
17-21 Nov 1986.
Place
Bucharest (Romania).

INIS

Country of Publication
Poland
Country of Input or Organization
Poland
INIS RN
21012071
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
CAMERAS; EXPERIMENTAL DATA; FILMS; ION BEAMS; MASS SPECTROMETERS; PLASMA FOCUS DEVICES; RESEARCH PROGRAMS; TIME RESOLUTION; X RADIATION
Descriptors DEC
BEAMS; DATA; ELECTROMAGNETIC RADIATION; INFORMATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; NUMERICAL DATA; OPEN PLASMA DEVICES; RADIATIONS; RESOLUTION; SPECTROMETERS; THERMONUCLEAR DEVICES; TIMING PROPERTIES

Optional Information

Notes
Received in 1988.