Published October 1974 | Version v1
Book

Use of ion implantation for creating a P well in N silicon: realization of complementary transistors

  • 1. CEA Centre d'Etudes Nucleaires de Grenoble, 38 (France). Lab. d'Electronique et de Technologie de l'Informatique
  • 2. Societe Europeenne des Semiconducteurs et Microelectroniques (SESCOSEM), 75 - Paris (France)
  • 3. Thomson-CSF, 75 - Paris (France)

Description

Circuits involving complementary MOS transistors were obtained by simultaneously realizing P and N MOS transistors on the same substrate from predeposition by ion implantation

Abstract (French)

Des circuits a transistors MOS complemetaires ont ete obtenus en realisant sur le meme substrat des transistors MOS a canal P et a canal N a partir d'une predeposition par implantation ionique

Additional details

Additional titles

Original title (French)
Utilisation de l'implantation ionique pour la creation d'un caisson P dans du silicium N: realisation de transistors complementaires

Publishing Information

Publisher
Societe Francaise du Vide.
Imprint Place
Paris, France
Imprint Title
Electron and ion beam processes applications. 4. International congress AVISEM 74. Toulouse, October 8-11, 1974
Imprint Pagination
p. 278-284.

Conference

Title
4. International congress AVISEM 74. Application of electronic and ionic processes.
Dates
08 Oct 1974.
Place
Toulouse, France.

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
7240498
Subject category
S07: ISOTOPES AND RADIATION SOURCES;
Resource subtype / Literary indicator
Conference
Descriptors DEI
FABRICATION; ION IMPLANTATION; MOS TRANSISTORS; PERFORMANCE
Descriptors DEC
SEMICONDUCTOR DEVICES; TRANSISTORS

Optional Information

Notes
Imprint:Supplement to the journal Le Vide les Couches Minces no. 171.;Application des processus electroniques et ioniques. 4. Congres international AVISEM 74. Toulouse, 8-11 Octobre 1974.