Published 1998
| Version v1
Journal article
Study of crystallographic properties in thin films of ZnxCd1-x S and CdSeyS1-y
- 1. Departamento de Fisica, Universidad Nacional de Colombia, Bogota (Colombia)
- 2. Universidad de Quindio, Armenia (Colombia)
Description
Crystallographic properties of ZNxCd1-x S and CdSe1-y Sy polycrystalline thin films deposited by evaporation were studied through X-ray diffraction and photoluminescence measurements. From these studies, it was determined the effect of the chemical composition on the crystalline structure, lattice parameters and crystallographic quality of the samples. It was found that the samples of ZnxCd1-x S and CdSe1-y Sy grow in a texturized way and that the binary CdS and Cd Se compounds present a mixture of the cubic and hexagonal phases. Under some specific evaporation conditions it was possible to grow the following ternary phases CdS0.813 Se0.187 , CdSe0.571 Se0.429 and Zn0.78Cd0.22 S. (Author)
Additional details
Publishing Information
- Journal Title
- Revista Mexicana de Fisica
- Journal Volume
- 44
- Journal Issue
- Suppl.3
- Journal Page Range
- p. 97-100
- ISSN
- 0035-00IX
- CODEN
- RMXFAT
Conference
- Title
- 14. Latin American Symposium on Solid State Physics
- Dates
- 11-16 Jan 1998
- Place
- Oaxaca, Oaxaca (Mexico)
INIS
- Country of Publication
- Mexico
- Country of Input or Organization
- Mexico
- INIS RN
- 30008784
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CADMIUM COMPOUNDS; CRYSTALLOGRAPHY; DIAGRAMS; GAS LASERS; PHOTOLUMINESCENCE; POLYCRYSTALS; SCANNING ELECTRON MICROSCOPY; SOLID STATE PHYSICS; SPECTROSCOPY; THIN FILMS; VACUUM EVAPORATION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTRON MICROSCOPY; EMISSION; EVAPORATION; FILMS; INFORMATION; LASERS; LUMINESCENCE; MICROSCOPY; PHASE TRANSFORMATIONS; PHOTON EMISSION; PHYSICS; SCATTERING