Optical studies in gamma-irradiated commercial soda-lime silicate glasses
Creators
Description
Optical absorption measurements of gamma-irradiated (60Co) commercial soda-lime silicate (SLS) glasses were performed at room temperature (RT) to detect and characterize the induced radiation damage in these materials. Isothermal bleaching (RT-723 K) of the radiation-induced defects, followed the irradiation of samples. In glasses containing different amount of the glass-network modifiers (Na2O, K2O) and some multivalent transition metal cations (Fe2+/Fe3+, Ni2+ and/or Mn2+) three absorption bands have been distinguished in the wavelength region extending from 250 to 1800 nm. In contrast to the electron-type color centers, detected at low temperatures for X-irradiated nominally pure sodium silicates , we propose that the absorption bands found for gamma-irradiated SLS glasses are induced by some hole-type color centers related with nonbridging oxygen ions (NBO-) located in different surroundings. The radiation-induced enhancement of diffusivity of ions together with bond breaking and defect creation in the glass-network could give materials with well-defined nonlinear optical properties
Additional details
Identifiers
- PII
- S0168583X00006959;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 179
- Journal Issue
- 3
- Journal Page Range
- p. 383-388
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 33054154
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ABSORPTION; AMBIENT TEMPERATURE; GAMMA RADIATION; GLASS; OPTICAL PROPERTIES; PHYSICAL RADIATION EFFECTS; SILICATES
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATION EFFECTS; RADIATIONS; SILICON COMPOUNDS; SORPTION
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.