Measuring the Stokes parameters of radiation of semiconductor lasers

We have developed and tested an original method for measuring the Stokes parameters for semiconductor lasers, based on the binding of the coordinate system to the test sample. The proposed method, when using an arbitrary phase plate as a compensator, allows one to measure the polarisation characteristics of lasers operating in a wide range of wavelengths - from 600 to 1000 nm. Application of the Fourier analysis to the quasi-continuous experimental data obtained with the help of automated systems of acquisition and processing of measurement results and ordinary optical elements provides accuracy that is sufficient to record the peculiarities of the polarisation characteristics of modern laser diodes.