Published 1979
| Version v1
Miscellaneous
Novel experimental method for determination of radiation-induced damage profiles using backscattering yield measurement
Creators
Description
no abstract available
Additional details
Additional titles
- Original title (Russian)
- Novyj ehksperimental'nyj metod dlya opredeleniya profilej radiatsionnykh povrezhdenij s pomoshch'yu izmereniya vykhoda obratnogo rasseyaniya
Publishing Information
- Imprint Title
- Preliminary program and summaries of reports of the 10. Conference on problems of charged particle beams using for studying substance composition and properties
- Journal Page Range
- p. 119-120.
- Report number
- INIS-mf--5499
Conference
- Title
- 10. Conference on problem of charged particle beams using for studying substance composition and properties.
- Dates
- 28 - 30 May 1979.
- Place
- Moscow, USSR.
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 11509661
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- BACKSCATTERING; DEPTH; ION CHANNELING; MEASURING METHODS; PHYSICAL RADIATION EFFECTS; POINT DEFECTS; SPATIAL DISTRIBUTION; SPECTRA
- Descriptors DEC
- CHANNELING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIMENSIONS; DISTRIBUTION; RADIATION EFFECTS; SCATTERING
Optional Information
- Notes
- Short note. Imprint:Predvaritel'naya programma i tezisy dokladov 10. Soveshchaniya po problemam primeneniya puchkov zaryazhennykh chastits dlya izucheniya sostava i svojstv veshchestva.