Published May 1, 2009
| Version v1
Journal article
Distribution of carbon in polycrystalline copper surfaces treated by methane plasma immersion ion implantation
- 1. Technische Universitaet Darmstadt, Department of Materials Science, Darmstadt (Germany)
- 2. Industrial Technology Center of Nagasaki, Applied Technology Division, Omura, Nagasaki (Japan)
Description
Copper substrates with rather large grains (dimensions of some mm) treated by pulsed methane plasma immersion ion implantation exhibit a laterally inhomogeneous carbon distribution. Areas with high carbon X-ray intensity in electron probe microanalysis coincide with thicker carbon containing layers as seen in sputter depth profiling via secondary ion mass spectrometry. The distribution of carbon within the surface depends not only on the treatment time and pulse repetition rate but also on the orientation of the individual copper grains.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2009.01.126Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2009.01.126;
- PII
- S0168-583X(09)00128-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 267
- Journal Issue
- 8-9
- Journal Page Range
- p. 1531-1535
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 16. international conference on ion beam modification of materials
- Dates
- 31 Aug - 5 Sep 2008
- Place
- Dresden (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41029207
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARBON; COPPER; DEPTH; DISTRIBUTION; ELECTRON MICROPROBE ANALYSIS; ION IMPLANTATION; ION MICROPROBE ANALYSIS; IONS; LAYERS; MASS SPECTROSCOPY; METHANE; ORIENTATION; PLASMA; POLYCRYSTALS; PULSES; SPUTTERING; SUBSTRATES; SURFACES; X RADIATION
- Descriptors DEC
- ALKANES; CHARGED PARTICLES; CHEMICAL ANALYSIS; CRYSTALS; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELEMENTS; HYDROCARBONS; IONIZING RADIATIONS; METALS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; NONMETALS; ORGANIC COMPOUNDS; RADIATIONS; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.